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http://148.72.244.84:8080/xmlui/handle/xmlui/10695Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ebtisam K.al- Bity | - |
| dc.contributor.author | Ahmad M. obead | - |
| dc.contributor.author | Rasha A. Abdullah | - |
| dc.contributor.author | Muhammad A. al_Aani | - |
| dc.date.accessioned | 2023-12-06T06:17:35Z | - |
| dc.date.available | 2023-12-06T06:17:35Z | - |
| dc.date.issued | 2012 | - |
| dc.identifier.issn | 2222-8373 | - |
| dc.identifier.uri | http://148.72.244.84:8080/xmlui/handle/xmlui/10695 | - |
| dc.description.abstract | A polycrystalline CdS Films have been evaporated by thermal evaporation technique with different thicknesses under vacuum of about 8 × 10 about 373 K on glass substrates, the films annealed at 573K for different duration times (60, 120 and180 min.). The structural properties of the films have been studied by X- ray diffraction technique, some structural parameters like miller indices, dstnd, dexp, I/Io stnd and I/Io have been calculated and compared for the CdS alloy and films. | en_US |
| dc.description.sponsorship | https://djps.uodiyala.edu.iq/ | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | university of Diyala | en_US |
| dc.subject | structural proparties CdS or thin film CdS | en_US |
| dc.title | Spectral study to investigate the structural properties of thin CdS films with different thicknesses by X-ray diffraction | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | مجلة ديالى للعلوم الاكاديمية / Academic Science Journal (Acad. Sci. J.) | |
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