Please use this identifier to cite or link to this item: http://148.72.244.84:8080/xmlui/handle/xmlui/4329
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dc.contributor.authorAmin Daway Thamir-
dc.contributor.authorAdawiya J. Haider-
dc.contributor.authorGhalib A. Ali-
dc.date.accessioned2023-10-17T16:11:01Z-
dc.date.available2023-10-17T16:11:01Z-
dc.date.issued2016-
dc.identifier.issn1999-8716-
dc.identifier.urihttps://djes.info/index.php/djes-
dc.identifier.urihttp://148.72.244.84:8080/xmlui/handle/xmlui/4329-
dc.description.abstractIn the present work, the titanium oxide platinum (TiO2/Pt) composite particles were deposited on the Si and glass substrates at (400)°C using pulsed laser deposition technique to ablation of TiO2 target at constant laser energy 800 mJ, a double frequency Q-switching Nd: YAG laser beam ( λ= 532 nm, repetition rate 6Hz and the pulsed duration 10ns). Ultraviolet visible (UV-Vis) spectroscopy, X-ray diffraction (XRD),X-ray fluorescence (XRF), Atomic force microscopy (AFM),Scanning Electron Microscopy (SEM), electrical conductivity (σdc), Hall coefficient (RH) ,(I-V) and (C-V) were used to characterize the morphology and electrical of the films. The results showed that the transparency of film reached to about (80%) with optical band gap (3.64) and (3.76) eV for Pure TiO2 and 5% Pt:TiO2 respectively. The structural and composition of the obtained films at level 5% of platinum doping into TiO2 have been determined. The results indicated that the prepared films (Pt doped TiO2) were nanostructure and uniform with diameters less than 20 nm.en_US
dc.language.isoenen_US
dc.publisherUniversity of Diyala – College of Engineeringen_US
dc.subjectPulsed Laser Deposition Techniqueen_US
dc.subjectPt Doped TiO2en_US
dc.titleDeposition of TiO2/PT Composite Particles Using Pulsed Laser Deposition Techniqueen_US
dc.typeArticleen_US
Appears in Collections:مجلة ديالى للعلوم الهندسية / Diyala Journal of Engineering Sciences (DJES)

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