Please use this identifier to cite or link to this item: http://148.72.244.84:8080/xmlui/handle/xmlui/9036
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dc.contributor.authorAli Kadhim Taki-
dc.date.accessioned2023-11-15T07:57:44Z-
dc.date.available2023-11-15T07:57:44Z-
dc.date.issued2014-
dc.identifier.issn2222-8373-
dc.identifier.urihttp://148.72.244.84:8080/xmlui/handle/xmlui/9036-
dc.description.abstractThree different thickness ( 200 ٫ 300 ٫400 ) ±20 nm thin films of ( CdO ) were prepared by vacuum thermal evaporation by depositing pure cadmium on a glass substrates at a temperature ( 300 ) K with a deposition rate ( 3.2 ± 0.1 ) nm/sec. The prepared films were oxidized at a temperature of (623) K for two hours in air. The structural properties study for the films were carried out using ( XRD ) . It is found that all the prepared films were polycrystalline and have a cubic type with preferred orientation along [111] plane. Transmittance spectrum was recorded as a function of wavelength ranging from (300 – 1100) nm for the films in order to calculate the value of the optical energy gap, kind of transitions ,optical constants as a function of photon energy, absorption coefficient , refractive index were included .en_US
dc.description.sponsorshiphttps://djps.uodiyala.edu.iq/en_US
dc.language.isoenen_US
dc.publisheruniversity of Diyalaen_US
dc.subjectCadmium oxide, thermal evaporation, structural properties , optical propertiesen_US
dc.titleStudy of thickness effect on some structural and optical properties of (CdO) thin films prepared by vacuum thermal evaporation method.en_US
dc.typeArticleen_US
Appears in Collections:مجلة ديالى للعلوم الاكاديمية / Academic Science Journal (Acad. Sci. J.)

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