Please use this identifier to cite or link to this item: http://148.72.244.84:8080/xmlui/handle/xmlui/9057
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dc.contributor.authorMehdi H. Diwan-
dc.date.accessioned2023-11-15T08:32:49Z-
dc.date.available2023-11-15T08:32:49Z-
dc.date.issued2014-
dc.identifier.issn2222-8373-
dc.identifier.urihttp://148.72.244.84:8080/xmlui/handle/xmlui/9057-
dc.description.abstractCadmium sulphide ( CdS ) thin films were prepared by the chemical Spray Pyrolysis technique on glass substrates at 400°C. The analysis of x-ray diffraction spectra XRD , patterns indicated the presence of single-phase hexagonal CdS which confirmed through the atomic force micrographs (AFM) images. The structural parameters such as interplannar distance (d), lattice constant (a), grain size (D), and micro strain have been evaluated, The crystal growth became stronger and more oriented as seen in the x-ray diffraction spectra and grain size became larger with increasing in the thickness. The optical properties have been studied in the range (300-900)nm. It is observed that the direct band gap energy is inversely depended on film thickness from (2.36–2.34) eV.en_US
dc.description.sponsorshiphttps://djps.uodiyala.edu.iq/en_US
dc.language.isoenen_US
dc.publisheruniversity of Diyalaen_US
dc.subjectCdS thin films, Optical and Structural Properties ,Spray Pyrolysis.en_US
dc.titleEffect of Film thickness on Optical and Structural Properties of CdS Thin Films prepared by spray pyrolysisen_US
dc.typeArticleen_US
Appears in Collections:مجلة ديالى للعلوم الاكاديمية / Academic Science Journal (Acad. Sci. J.)

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