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http://148.72.244.84:8080/xmlui/handle/xmlui/14105Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | صباح انور سلمان | - |
| dc.contributor.author | تحسين حسين مبارك | - |
| dc.contributor.author | اسعد احمد كامل | - |
| dc.date.accessioned | 2024-04-08T20:10:10Z | - |
| dc.date.available | 2024-04-08T20:10:10Z | - |
| dc.date.issued | 2006 | - |
| dc.identifier.citation | http://148.72.244.84:8080/jspui/password-login | en_US |
| dc.identifier.issn | 1996-8752 | - |
| dc.identifier.uri | http://148.72.244.84:8080/xmlui/handle/xmlui/14105 | - |
| dc.description.abstract | It had been measuring the resistivity for the CuIn (Se0.2Te0.8)2 and CuIn (Se0.8Te0.2)2 thin films which perpetrated by vacuum thermal evaporation with a thickness of (225±5nm) in the thermal range of (300–473K) for both as deposited and annealed samples at temperatures (373K, 473K) for one hour in the existence vacuum (10-2Torr). It had been calculation activation energies for these films before and after annealing. | en_US |
| dc.language.iso | other | en_US |
| dc.publisher | مجلة الفتح للعلوم التربوية والنفسية | en_US |
| dc.relation.ispartofseries | 10;2 | - |
| dc.title | الرقيقة cu in se0.8 te0.2 .culn se0 te0.8 دراسة بعض الخواص الكهربائية لاغشية | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | مجلة الفتح / The Al-Fateh Journal for Educational and Psychological Research | |
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