Abstract: A method of computing dynamic load factor under harmonic load is suggested. The method is based on the representation of the dynamic stress intensity factors in form corresponding to normalized free vibration ...

It had been measuring the resistivity for the CuIn (Se0.2Te0.8)2 and CuIn (Se0.8Te0.2)2 thin films which perpetrated by vacuum thermal evaporation with a thickness of (225±5nm) in the thermal ...